The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

Decker, University of Karlsruhe, Germany) PIONEER Two EBL Applications PIONEER Two SEM Applications: SEM image of a Bi2-Ca2-Co compound imaged at 1.5 kV, standard Everhart-Thornley secondary electron ...