The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

In-column backscattered (EsB) and secondary electron (SE) detectors are used to image the milled surfaces. As a result, a large series of images can be automatically acquired and combined into a 3D ...

Acquire topographical and compositional information with the optional InLens Duo detector. Enjoy a new generation of secondary electron (SE) detectors. Obtain images with up to 50% more signal.

The Zeiss Evo 15 is a user-friendly scanning electron microscope (SEM), located in LG45a of the Life Sciences Building, offering standard high vacuum, variable pressure and environmental modes. It is ...

Everhart Thornley secondary electron detector Electron flood gun for charge compensation 5 axis motorized stage transmission camera (Medipix 256 x 256 pixels 55 microns, avalanche photodiode array) ...

Decker, University of Karlsruhe, Germany) PIONEER Two EBL Applications PIONEER Two SEM Applications: SEM image of a Bi2-Ca2-Co compound imaged at 1.5 kV, standard Everhart-Thornley secondary electron ...

and a SEM equipped with a backscattered electron detector, a cathodoluminescence detector, and a light-element energy dispersive x-ray detector (capable of detection of elements with atomic number of ...

The Energy Dispersive X-Ray (EDX) Silicon Drift Detector (SDD) is fully incorporated into the NANOS. The operator can choose EDX Point Analysis or activate Elemental Mapping using the User Interface.

The Phenom Pure Desktop SEM can be fitted with two optional detector systems. The first one is a completely integrated energy dispersive spectroscopy (EDS) system, and the second is a secondary ...

Obtain crisp, sharp topographical details with the new secondary electron (SE) detector that delivers up to 50% more signal. New VP and EP imaging detectors provide improved signal at higher ...